DAGE4800INTEGRA

BONDTESTER

Semiconductor Wafer Tester

클린룸 기반의 웨이퍼 핸들링 통합 모델

“DAGE4800INTEGRA는 많은 수량의 웨이퍼를 테스트를 클린, 안전하게 테스트하여 높은 테스트 처리량을 달성하고 있습니다.”

COMPARISON of 4000OPTIMA and 4000PLUS4000OPTIMA4000PLUS
UsageProduction Bond TestAdvanced Bond Test
PrecisionVery high precisionVery high precision
Typical productComplex and high density componentsComplex and high density components
Test capabilities and max loads
Pull50 kg100 kg
Shear200 kg200 kg
Cold bump pull5 kg10 kg
Zone shear20 kg20kg
Hot bump pull10kg
Automation
Automation (joystick step and repeat)
Automation (camera assist)(option)
XY axis travel
160 mm x 160 mm
210 mm x 300 mm(option)(option)
410 mm x 450 mm
XY speed
2 mm/s
3 mm/s
6 mm/s
50mm /s
Z axis travel + speed
65 mm + 5 mm/s
75 mm + 5mm/s
200 mm 20 mm/s

BONDTESTER